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Seamlessly combine functional testing with high-speed in-system programming (ISP) by embedding multi-channel programmers directly inside your test fixtures to drastically reduce overall line cycle time.
Integrated Device Programmers bring high-speed In-System Programming (ISP) directly into the testing phase, eliminating the need for separate pre-programming operations. In modern electronics manufacturing, microcontrollers, flash memories, programmable logic devices, and EEPROMs require firmware and configuration data before a board can become functional. Integrating dedicated programmer hardware directly inside In-Circuit Test (ICT) and Functional Test (FCT) fixtures allows firmware flashing to occur automatically during the standard electrical test cycle.
By embedding multi-channel programming interfaces within the test fixture, production lines achieve substantial throughput improvements. Boards are physically clamped and powered up once, allowing the system to verify electrical continuity, flash operating firmware, and execute functional logic tests in a continuous sequence. This integrated approach drastically shortens total production time, minimizes manual board handling, and prevents unprogrammed or incorrectly flashed PCBAs from moving downstream in the assembly line.
Programming Performance & Architecture
Flashes microcontrollers, serial/parallel flash memories, CPLDs, and FPGAs at maximum bus speeds directly through the fixture's test probes.
Supports simultaneous programming of multiple target devices or multi-panel (gang) PCBAs within a single test cycle to optimize line beat rate.
Integrates hardware modules compatible with standard programming interfaces including JTAG, SWD, SPI, I2C, UART, BDM, and custom vendor protocols.
Process Automation & Quality Control
Consolidates board testing and firmware loading into a single handling step, drastically cutting overall line cycle times and labor costs.
Interrogates target chips to verify checksums and enforce correct firmware revision deployment linked directly to the MES work order.
Supports dynamic injection of unique serial numbers, MAC addresses, cryptographic keys, and calibration data during the flashing sequence.
We combine state-of-the-art manufacturing with stringent quality control to ensure smooth test operations, zero false failures, and maximum uptime. By offering our custom engineering solutions at competitive prices and with rapid lead times, we provide the reliable testing infrastructure you need to scale production without compromising your schedule or bottom line.
Partner with us to scale your products with confidence, knowing your testing infrastructure is built to perform.
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